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microscopy

Am STEM Studio

Offline Windows tool for CIF geometric projections, ROI calibration, FFT measurement and indexing, rigid registration and atom overlays. Standard edition excludes tilt scanning and multislice.

v2.1.0
Windows version — activation required

The Windows client requires a valid machine-bound license. On first launch, copy the Machine ID and send it to the developer. The developer manually issues activation; enter the code or import the license file as instructed by the client.

Overview

Am STEM Studio screenshot 1Am STEM Studio screenshot 2

Features

  • Import CIF and expand crystallographic symmetry with occupancy-aware geometric projections.
  • Select an image ROI, calibrate nm/pixel manually, measure FFT spots and inspect candidate indexing.
  • Adjust rigid rotation and translation with fixed physical scale; customize colored atom markers and export PNG / JSON.
  • Standard: geometric tilt scanning and multislice are not enabled.

Version history

Sign in to download. A machine-bound license is required to run.

v2.1.0 · Machine-bound activation required; validity follows the issued license. Contact on Xiaohongshu for usage and support ↗ Minor updates within the same series retain valid licenses.

v2.1.0Current
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Updates & usage guides

Follow our WeChat and Xiaohongshu accounts for Am STEM Studio version updates, tutorials and case studies.

WeChat Official Account

迷之炼金术士

迷之炼金术士 WeChat QR code
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